説明
Digital imaging combined with advanced optical system
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
Microscope type
- Dedicated reflected illumination models
- Manual type
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
Compatible observation methods:
Compatible stages
- LV-S32 3×2 stage (Stroke: 75 x 50 mm with glass plate)
*Can be fitted with LV-S32SPL ESD plate - LV-S6 6×6 stage (Stroke: 150 x 150 mm)
*Can be fi tted with LV-S6WH wafer holder / LV-S6PL ESD plate - LV-SRP P revolving stage
- P-GS2 G stage 2 (Used with stage adapter LV-SAD)
Newly developed CFI60-2 series
Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
CFI60-2 series offers higher NA and longer working distances than ever before.
