{"id":724,"date":"2018-12-23T01:52:49","date_gmt":"2018-12-22T18:52:49","guid":{"rendered":"http:\/\/hieuchuan3d.com\/?post_type=product&#038;p=724"},"modified":"2021-05-15T10:44:48","modified_gmt":"2021-05-15T03:44:48","slug":"kinh-hien-vi-nikon-eclipse-lv150n","status":"publish","type":"product","link":"https:\/\/backup.hieuchuan3d.com\/en\/san-pham\/kinh-hien-vi-nikon-eclipse-lv150n\/","title":{"rendered":"(Ti\u1ebfng Vi\u1ec7t) K\u00ednh hi\u1ec3n vi NIKON ECLIPSE LV150N"},"content":{"rendered":"<p class=\"qtranxs-available-languages-message qtranxs-available-languages-message-en\">Sorry, this entry is only available in <a href=\"https:\/\/backup.hieuchuan3d.com\/vi\/wp-json\/wp\/v2\/product\/724\" class=\"qtranxs-available-language-link qtranxs-available-language-link-vi\" title=\"Ti\u1ebfng Vi\u1ec7t\">Vietnamese<\/a>. For the sake of viewer convenience, the content is shown below in the alternative language. You may click the link to switch the active language.<\/p><p><strong><img decoding=\"async\" src=\"http:\/\/topmetrology.ro\/img\/cms\/Eclipse-LV150N.jpg\" alt=\"\" width=\"720\" height=\"227\" \/><\/strong><\/p>\n<h3><span class=\"glossary\">Digital imaging<\/span>\u00a0combined with advanced optical system<\/h3>\n<div class=\"object-right\">\n<div class=\"content-view-embed\">\n<div class=\"class-image\">\n<div class=\"attribute-image\"><\/div>\n<\/div>\n<\/div>\n<\/div>\n<p>A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer\u00a0<span class=\"glossary\">working distance<\/span>\u00a0than ever before means superior optical performance and efficient\u00a0<span class=\"glossary\">digital imaging<\/span>.<\/p>\n<p>Max. sample size: 150 x 150 mm.<\/p>\n<div class=\"feature\">\n<h3>Microscope type<\/h3>\n<div class=\"desc\">\n<ul>\n<li>Dedicated reflected illumination models<\/li>\n<li>Manual type<\/li>\n<\/ul>\n<div class=\"clear\"><\/div>\n<\/div>\n<\/div>\n<div class=\"feature\">\n<h3>Modularized microscope body applicable with various observations and tasks<\/h3>\n<div class=\"desc\">\n<p>Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.<br \/>\nIt supports diverse and advanced research, analysis and inspection.<\/p>\n<p><em><strong>Compatible observation methods:<\/strong><\/em><\/p>\n<div class=\"object-center\">\n<div class=\"content-view-embed\">\n<div class=\"class-image\">\n<div class=\"attribute-image\"><img decoding=\"async\" title=\"LV150N Compatible observation methods\" src=\"http:\/\/nikonmetrology.com\/var\/ezwebin_site\/storage\/images\/media\/images\/lv150n-compatible-observation-methods\/260364-1-eng-GB\/LV150N-Compatible-observation-methods.jpg\" alt=\"LV150N Compatible observation methods\" width=\"737\" height=\"133\" \/><\/div>\n<\/div>\n<\/div>\n<\/div>\n<div class=\"clear\"><\/div>\n<\/div>\n<\/div>\n<div class=\"feature\">\n<h3>Compatible stages<\/h3>\n<div class=\"desc\">\n<ul>\n<li>LV-S32 3&#215;2 stage (Stroke: 75 x 50 mm with glass plate)<br \/>\n<em>*Can be fitted with LV-S32SPL ESD plate<\/em><\/li>\n<li>\u00a0LV-S6 6&#215;6 stage (Stroke: 150 x 150 mm)<br \/>\n<em>*Can be fi tted with LV-S6WH wafer holder \/ LV-S6PL ESD plate<\/em><\/li>\n<li>LV-SRP P revolving stage<\/li>\n<li>P-GS2 G stage 2 (Used with stage adapter LV-SAD)<\/li>\n<\/ul>\n<div class=\"clear\"><\/div>\n<\/div>\n<\/div>\n<div class=\"feature\">\n<h3>Newly developed CFI60-2 series<\/h3>\n<h3>Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body<\/h3>\n<div class=\"desc\">\n<p>CFI60-2 series offers higher NA and longer working distances than ever before.<\/p>\n<\/div>\n<\/div>\n<p><img decoding=\"async\" src=\"http:\/\/topmetrology.ro\/img\/cms\/Easy-digital-imaging.jpg\" alt=\"\" width=\"352\" height=\"335\" \/><\/p>","protected":false},"excerpt":{"rendered":"<p>Sorry, this entry is only available in Vietnamese. For the sake of viewer convenience, the content is shown below in the alternative language. You may click the link to switch the active language. Digital imaging\u00a0combined with advanced optical system A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis [&hellip;]<\/p>\n","protected":false},"featured_media":1633,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"product_cat":[34],"product_tag":[217],"acf":[],"_links":{"self":[{"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/product\/724"}],"collection":[{"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/comments?post=724"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/media\/1633"}],"wp:attachment":[{"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/media?parent=724"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/product_cat?post=724"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/backup.hieuchuan3d.com\/en\/wp-json\/wp\/v2\/product_tag?post=724"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}