{"id":1021,"date":"2019-11-23T16:03:39","date_gmt":"2019-11-23T09:03:39","guid":{"rendered":"http:\/\/hieuchuan3d.com\/?post_type=product&p=1021"},"modified":"2019-11-23T16:03:41","modified_gmt":"2019-11-23T09:03:41","slug":"automatic-cmm-touch-scanning-probe-sp25m-revo-dau-do-cham-cho-may-cmm-tu-dong-sp25m-revo","status":"publish","type":"product","link":"https:\/\/backup.hieuchuan3d.com\/en\/san-pham\/automatic-cmm-touch-scanning-probe-sp25m-revo-dau-do-cham-cho-may-cmm-tu-dong-sp25m-revo\/","title":{"rendered":"(Ti\u1ebfng Vi\u1ec7t) Automatic CMM Touch Scanning Probe, SP25M, REVO\/ \u0110\u1ea7u \u0111o ch\u1ea1m cho m\u00e1y CMM t\u1ef1 \u0111\u1ed9ng SP25M, REVO"},"content":{"rendered":"

Sorry, this entry is only available in Vietnamese<\/a>. For the sake of viewer convenience, the content is shown below in the alternative language. You may click the link to switch the active language.<\/p>

As one of the leading China CMM manufacturers and suppliers, We also provide sp25m, revo touch scanning head. It is here waiting for your contact.<\/p>\n

1.SP25M<\/strong><\/p>\n

Scanning provides large amounts of data,which can be used to determine the ‘fitness for purpose’ of complex components. Where a number of features form functional fits with other parts, the form or shape of the feature is critical and a scanning sensor is most appropriate.<\/p>\n

\"renishaw\u00a0 \u00a0 \u00a0 \u00a0\u00a0\"sp25<\/p>\n

Specifications:<\/strong><\/p>\n\n\n\n\n\n\n\n\n\n
Mounting<\/td>\nRenishaw\u2019s autojoint: PH10M, PH10MQ or PH6 heads<\/td>\n<\/tr>\n
Probe attributes<\/td>\n3 axis analogue measurement (X, Y, Z)<\/p>\n

Pivoting motion in XY plane with translation in Z<\/td>\n<\/tr>\n

Measurement range<\/td>\n\u00b10.5 mm (\u00b10.02 in) deflection in all directions in all \u00a0 orientations<\/td>\n<\/tr>\n
Overtravel range<\/td>\n\u00b1X, \u00b1Y = 2.0 mm (0.08 in)<\/p>\n

+Z = 1.7 mm (0.07 in)<\/p>\n

-Z = 1.2 mm (0.05 in)<\/td>\n<\/tr>\n

Crash protection<\/td>\nX, Y, -Z via break-off of either module or stylus holder<\/p>\n

+Z via integral bump-stop design<\/td>\n<\/tr>\n

Power supply<\/td>\n+12 V (\u00b15%), -12 V (+10% \/ -8%),<\/p>\n

+5 V (+10% \/ +13%) DC at probe<\/td>\n<\/tr>\n

Probe calibration<\/td>\nSP25M requires a non-linear, third-order polynomial \u00a0 calibration method<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n